RAMaker Micro Raman/PL/TR-PL Spectrometer
Introducing the RAMaker, our advanced Raman spectroscopy instrument, embodying precision and innovation in spectroscopic analysis. Recognized with patents in Taiwan and the USA, this advanced Raman spectroscopy instrument is a testament to our commitment to quality and accuracy, requiring no recalibration and offering fully optimized laser wavelengths for meticulous measurements.
Patented Optical Design for Enhanced Performance
The RAMaker boasts a patented optical design, acknowledged in both Taiwan and the USA, which delivers a high-quality system that doesn’t need recalibration. Moreover, this system benefits from fully optimized and set laser wavelengths that ensure accurate readings.
Furthermore, designed with an innovative horizontal interlace, the MRID’s optical pathway is ingeniously crafted. This design allows the addition of a third laser module or more, significantly expanding its application scope. Presently, the MRID comes with two fixed lasers and provides the option to add others via optical fibers, offering exceptional adaptability. As a result, users can freely swap and tailor laser options to meet their needs. This adaptability opens doors to a wide spectrum of measurement applications, positioning the MRID as an indispensable instrument for diverse research and analytical tasks.
Automatic Wavelength Switching and Control
Step into the world of fully automated micro-Raman switching with software-controlled light sources. Our patented design guarantees consistent optical performance and simple sample co-location measurements.
Exceptional Focus and Resolution
With our advanced confocal design, including two sets of confocal apertures, you can experience a signal resolution improvement of over 30%.
Robust and Sensitive Detectors
Our detectors are not only robust but also highly sensitive and produce minimal noise, enhancing system sensitivity. These features make it possible to detect even the third-order peak of a silicon wafer with an S/N ratio surpassing 20:1.
Flexible and Precise Sample Observation
Equipped with a 5-megapixel CCD and a 5-watt LED light source, the RAMaker provides a crisp image of your sample. Additionally, the system’s software flawlessly manages Raman measurements and surface image observations, ensuring precise results.
Advanced Features for Comprehensive Analysis
- RPRM for polarized Raman measurements
- Continuous neutral density filters for accurate energy calibration
- Detectors covering a broad range of wavelengths for extensive analysis
Specifications and Upgrades
- Excitation Source (nm): Built-in: 355, 405, 473, 488, 532, 633, 785, 830 nm (Max. 3 in the chamber), External mount: 229, 248, 266, 325, 1064 nm
- Raman Shift (cm^-1): 79 cm^-1 to 9000 cm^-1. Lowest: 10 cm^-1 (on request)
- Spectral Range (nm): Max 2 detector Selected 200 ~ 1100 nm; 900 ~ 1700; 900 ~ 2500 nm
- Spectral Resolution (cm^-1): Standard 0.9 cm^-1 up to 0.3 cm^-1
- Slit Range (μm): 10 μm ~ 2.5 mm / 3 mm / 15 mm, manual or controlled by software
- Detector: 1024×256 pixels, TE cooled, -70 °C to -100 °C, UV/NIR enhanced coating
- Detector background: Dark current 0.0014 e-/pixel/sec; read noise < 4; speed 8,16,32,64 µs (software selectable)
- Grating (gr/mm): Max 4 grating Selected 150, 300, 600, 1200, 1800, 2400, 3600 gr/mm, controlled and optima by software.
- Focal Length (mm): Selected 193, 328, 500, 750 mm
- Spectral repeatability: ≤0.1 cm^-1 Si sample 520 cm^-1 @50X objective lens, 50 repeat
Patented Optical Design for Enhanced Performance
The RAMaker boasts a patented optical design, acknowledged in both Taiwan and the USA, which delivers a high-quality system that doesn’t need recalibration. Moreover, this system benefits from fully optimized and set laser wavelengths that ensure accurate readings.
Furthermore, designed with an innovative horizontal interlace, the MRID’s optical pathway is ingeniously crafted. This design allows the addition of a third laser module or more, significantly expanding its application scope. Presently, the MRID comes with two fixed lasers and provides the option to add others via optical fibers, offering exceptional adaptability. As a result, users can freely swap and tailor laser options to meet their needs. This adaptability opens doors to a wide spectrum of measurement applications, positioning the MRID as an indispensable instrument for diverse research and analytical tasks.
Automatic Wavelength Switching and Control
Step into the world of fully automated micro-Raman switching with software-controlled light sources. Our patented design guarantees consistent optical performance and simple sample co-location measurements.
Exceptional Focus and Resolution
With our advanced confocal design, including two sets of confocal apertures, you can experience a signal resolution improvement of over 30%.
Robust and Sensitive Detectors
Our detectors are not only robust but also highly sensitive and produce minimal noise, enhancing system sensitivity. These features make it possible to detect even the third-order peak of a silicon wafer with an S/N ratio surpassing 20:1.
Flexible and Precise Sample Observation
Equipped with a 5-megapixel CCD and a 5-watt LED light source, the RAMaker provides a crisp image of your sample. Additionally, the system’s software flawlessly manages Raman measurements and surface image observations, ensuring precise results.
Advanced Features for Comprehensive Analysis
- RPRM for polarized Raman measurements
- Continuous neutral density filters for accurate energy calibration
- Detectors covering a broad range of wavelengths for extensive analysis
Specifications and Upgrades
- Excitation Source (nm): Built-in: 355, 405, 473, 488, 532, 633, 785, 830 nm (Max. 3 in the chamber), External mount: 229, 248, 266, 325, 1064 nm
- Raman Shift (cm^-1): 79 cm^-1 to 9000 cm^-1. Lowest: 10 cm^-1 (on request)
- Spectral Range (nm): Max 2 detector Selected 200 ~ 1100 nm; 900 ~ 1700; 900 ~ 2500 nm
- Spectral Resolution (cm^-1): Standard 0.9 cm^-1 up to 0.3 cm^-1
- Slit Range (μm): 10 μm ~ 2.5 mm / 3 mm / 15 mm, manual or controlled by software
- Detector: 1024×256 pixels, TE cooled, -70 °C to -100 °C, UV/NIR enhanced coating
- Detector background: Dark current 0.0014 e-/pixel/sec; read noise < 4; speed 8,16,32,64 µs (software selectable)
- Grating (gr/mm): Max 4 grating Selected 150, 300, 600, 1200, 1800, 2400, 3600 gr/mm, controlled and optima by software.
- Focal Length (mm): Selected 193, 328, 500, 750 mm
- Spectral repeatability: ≤0.1 cm^-1 Si sample 520 cm^-1 @50X objective lens, 50 repeat
